Electron Diffraction
Using Transmission Electron Microscopy

Electron diffraction via the transmissionelectron microscope is a powerful
method for characterizing the structure ofmaterials, including perfect crystals and
defect structures. The advantages of elec-tron diffraction over other methods, e.g.,
x-ray or neutron, arise from the extremely short wavelength (
2 pm), the strong
atomic scattering, and the ability to examine tiny volumes of matter (
10 nm3
).
The NIST Materials Science and Engineering Laboratory has a history of discovery
and characterization of new structures through electron diffraction, alone or in
combination with other diffraction methods.
This paper provides a survey of some of this work enabled through electron mi-
croscopy.
Key words: crystal structure; crystallog-raphy; defects; electron diffraction; phase
transitions; quasicrystals; transmission electron microscopy.

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